Wednesday, June 12, 2002, 8:30 AM - 10:00 AM | Room: 292 SESSION 18    Novel DFT, BIST and Diagnosis Techniques    Chair: Rathish Jayabharathi - Intel Corp., Folsom, CA    Organizers: TM Mak, Kwang Ting (Tim) Cheng    This session presents several novel ideas on DFT, BIST and diagnosis. The first paper discusses a DFT technique that utilizes clock control to simplify ATPG. The second paper tackles diagnosis problems with the conventional MISR signatures. The third paper presents a DFT technique to accommondate unknown output values in a BIST scheme. The last paper explores the diagnosis capability of software-based self-test.      18.1 Low-Cost Sequential ATPG with Clock-Control DFT    Speaker(s): Miron Abramovici - Agere Systems, Murray Hill, NJ    Author(s): Miron Abramovici - Agere Systems, Murray Hill, NJ Xiaoming Yu - Univ. of Illinois, Urbana, IL Liz Rudnick - Univ. of Illinois, Urbana, IL      18.2 Effective Diagnostics Through Interval Unloads in a BIST Environment    Speaker(s): Peter Wohl - Synopsys, Inc., Williston, VT    Author(s): Peter Wohl - Synopsys, Inc., Williston, VT Greg Maston - Synopsys, Inc., Denver, CO John Waicukauski - Synopsys, Inc., Tualatin, OR Sanjay Patel - Synopsys, Inc., Beaverton, OR      18.3 On Output Response Compression in the Presence of Unknown Output Values    Speaker(s): Irith Pomeranz - Purdue Univ., West Lafayette, IN    Author(s): Irith Pomeranz - Purdue Univ., West Lafayette, IN Sandip Kundu - Intel Corp., Austin, TX Sudhakar M. Reddy - Univ. of Iowa, Iowa City, IA      18.4 Software-Based Diagnosis for Processors    Speaker(s): Li Chen - Univ. of California at San Diego, La Jolla, CA    Author(s): Li Chen - Univ. of California at San Diego, La Jolla, CA Sujit Dey - Univ. of California at San Diego, La Jolla, CA